- All sections
- G - Physics
- G01R - Measuring electric variables; measuring magnetic variables
- G01R 31/3167 - Testing of combined analog and digital circuits
Patent holdings for IPC class G01R 31/3167
Total number of patents in this class: 108
10-year publication summary
2
|
7
|
9
|
10
|
8
|
12
|
8
|
9
|
8
|
1
|
2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
Xilinx, Inc. | 4086 |
6 |
Samsung Electronics Co., Ltd. | 131630 |
5 |
Qualcomm Incorporated | 76576 |
4 |
Robert Bosch GmbH | 40953 |
4 |
Texas Instruments Incorporated | 19376 |
3 |
Taiwan Semiconductor Manufacturing Company, Ltd. | 36809 |
3 |
NPX B.V. | 2204 |
3 |
Advantest Corporation | 1939 |
3 |
Cirrus Logic, Inc. | 1719 |
3 |
Leviton Manufacturing Co., Inc. | 844 |
3 |
ROHDE & Schwarz GmbH & Co. KG | 1831 |
3 |
NXP USA, Inc. | 4155 |
3 |
Seiko Epson Corporation | 18724 |
2 |
SK Hynix Inc. | 11030 |
2 |
Huawei Technologies Co., Ltd. | 100781 |
2 |
MTU America Inc. | 12 |
2 |
Tektronix, Inc. | 636 |
2 |
Teradyne, Inc. | 579 |
2 |
WesternGeco L.L.C. | 570 |
2 |
NXP B.V. | 2185 |
2 |
Other owners | 49 |